2 article(s) from Vandervorst, Wilfried
Electrical characterization of single nanometer-wide Si fins in dense arrays
- Steven Folkersma,
- Janusz Bogdanowicz,
- Andreas Schulze,
- Paola Favia,
- Dirch H. Petersen,
- Ole Hansen,
- Henrik H. Henrichsen,
- Peter F. Nielsen,
- Lior Shiv and
- Wilfried Vandervorst
Beilstein J. Nanotechnol. 2018, 9, 1863–1867, doi:10.3762/bjnano.9.178
Nanoscale electrochemical response of lithium-ion cathodes: a combined study using C-AFM and SIMS
- Jonathan Op de Beeck,
- Nouha Labyedh,
- Alfonso Sepúlveda,
- Valentina Spampinato,
- Alexis Franquet,
- Thierry Conard,
- Philippe M. Vereecken,
- Wilfried Vandervorst and
- Umberto Celano
Beilstein J. Nanotechnol. 2018, 9, 1623–1628, doi:10.3762/bjnano.9.154
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